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Q4, 2012:
  • APREL EM-ISight Full model list :Near Field Scanning System Integration

  • a). EM-ISight-1 ( 10k to 6GHz ) Single probe solution
    b). EM-ISight-2 ( 10k to 20GHz) Single probe solution
    c). EM-ISight-UG40 ( 10K to 40GHz )
    d). EM-ISight-UG60 ( 10K to 60 GHz )
  • Release EMI qualities qualification concept for IC Chipset, RF Module, LCD Panel
  • Released Pre-compliance concept using Far-Field Approximation software package




Q4, 2014:
  • APREL EM-ISight-ER( 85cm Arm reach ) Full model list : Near Field EMI Scanning System Integration with ESD test solution.

  • a). EM-ISight-1 ( 10k to 6GHz ) Single probe solution.
    b). EM-ISight-2 ( 10k to 20GHz) Single probe solution.
    c). EM-ISight-UG40 ( 10K to 40GHz ).
    d). EM-ISight-UG60 ( 10K to 60 GHz ).
  • Release EMI qualities qualification concept for IC- Chipset, RF Module, LCD Panel (IC-EMC Testing Solution)




Q3, 2015:
  • SGL announnced and delivered new product WTT-127A Wireless Throughput Measurement System.

  • WTT-127A Wireless Throughput Tester is a small form-factor anechoic chamber that comes fully integrated with a built-in turntable, 2 isolation shield enclosures for Client AP ( 2.5G & 5GHz) , signalinterference filters, programmable RF attenuators and an OTA (over the air) conduction port. The solution is shipped ready to test throughput in both Over The Air & Conductive modes with flexibility to perform other wireless performance parametric testing.
  • *Main Applications : Wireless Access Point, Wireless Devices (IEEE802.11,a/ac/b/g/n WiFi device)



 
 
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